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372 item(s)/page
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Hanwa R CDM Model HED-C5000R – Robotic Charged Device Model (CDM) ESD Test System W575 x D400 x H300 | Weight: 35 kg | Compact desktop size High-p...
PVA TePla VUE-250 P – C-Mode Scanning Acoustic Microscope (CSAM) The PVA TePla VUE-250 P is a state-of-the-art C-Mode Scanning Acoustic Microscope...
Hirayama HAST Chamber PC-422R8 – Highly Accelerated Stress Test System The Hirayama HAST PC-422R8 is a high-precision chamber designed for Highly ...
Hanwa HED-G5000 ESD HBM 1024pins 6Bias Power Supplies Ultra Low Parasitic High Pin Count ESD Tester
Hanwa HED-G5000 ESD Tester – HBM/MM Model with 1024 Pins and 6 Bias Power Supplies The Hanwa HED-G5000 is a high-end ESD tester designed for advan...
Signatone 6" Probe Station Prober
SpeedLine ACCEL MicroCel Centrifugal Cleaner System
Cascade 12000 200mm 8"" Wafer Prober
Cascade 12000 200mm 8"" Wafer Prober
Cascade 12000 200mm 8"" Wafer Prober
SemiProbe SA-12 300mm Semiautomatic 12"" Wafer Prober
Signatone C312-S Manual Wafer Prober 300mm
Signatone CM312 300mm Manual Wafer Prober With Isolation Table
Signatone CM100 6” Manual Wafer Prober Nickel Chuck
Rucker And Koll 5” Manual Prober
Micromanipulator 200MM 8060 Sub-Micron 8"" Wafer Prober
Micromanipulator 8060 200mm Sub-Micron 8"" Wafer Prober
Micromanipulator 8060 200mm Sub-Micron 8"" Wafer Prober
Prober Solutions Micromanipulator 200mm 8”Wafer Prober w/ New Wave LCSII 532 System
Karl Suss P8 8" 200mm Manual Wafer Prober
Sistema de sonda de obleas HF KLA 1007 de KLA Instruments Corporation, diseñado para pruebas de semiconductores y sondeo de obleas
Sensata / Qinex TCU-0536 Thermal Forcing System w/ Head
Sensata / Qinex TCU-0536 Thermal Forcing System w/ Head
Sensata / Qinex TCU-0534 Thermal Forcing System w/ Head
NI PXIe-1062Q Chassis with PXIe-8360, PXI-6259, PXIe-4154, PXI-4110 Modules
Schmidt Pneumatic Press Model 24-75-2K with PressControl 50 (2015)
Hirayama / HAST PC-422R9 Highly Accelerated Stress Test System 20hrs Used ONLY
Hirayama / HAST PC-422R9 Highly Accelerated Stress Test System 20hrs Used ONLY
Tel P12XLn 300mm 12" Wafer Prober FULLY FUNCTIONAL
Arbin LBT21084 Battery Testing System with PC & Monitor
Tokyo Electron Limited TEL P8XL 200mm Room Hot Wafer Prober
Tel P8 Fully Automatic Wafer Prober
Mahr MarOpto FI 1040 Z Laser Profilometer System w/ Workstation & Software
ELMAN EE_ATE Automated Test Equipment (ATE) System – 2020 – Italy
Zygo NewView 200 Interferometer with Precision Control Stage
Servomex DF-310E Industrial Oxygen Analyzer with Internal Sensor H01000-S-LS-110
California Instruments 1201WP Frequency Changer 1200VA 47-500Hz Output
Brookfield DV-III Ultra Rheometer w/ DV-III+ Base Unit & Display
Agilent 54754A TDR Module 18GHz 4-Channel Differential
Agilent 16903A Logic Analysis System – 16900 Series
Tektronix TLA 704 / TLA 714Logic Analyzer
Agilent U2722A Source Measure Unit
Advantest D3286 Error Detector 3.2Gbps
Advantest D3186 Pulse Pattern Generator & Error Detector 3.2Gbps
Ion Torrent PGM Dx Personal Genome Machine Model 7469 – Thermo Fisher Scientific
HiTek Power LTD, Mod: OL1K/103/17A1036790 Power Conditioner
Azimuth ACE 400WB/Wi-Fi MIMO Channel Emulator for Mobile WiMAX Wireless Testing
Tektronix TDS3054 500MHz 5GS/s 4-Channel Digital Phosphor Oscilloscope DPO
Tektronix TCPA300 + TCP312 AC/DC Current Probe System – 30A
Anritsu MP1653A Error Detector 0.05 - 3 GHz
Agilent 8960 Series 10 Wireless Communication Test Set, Model E5515C
EATON V48M24T1516 15 kVA Transformer, Dry-Type, 480V Delta to 208Y/120V
Tektronix TCP312 Current Probe 30A DC/AC with Soft Case
LaserMike Diameter Measurement System by Techmet
GE Drive Isolation Transformer 27 KVA, 3-Phase, Type QL, Mod 9T83B4002G28
Agilent 6671A SYSTEM DC POWER SUPPLY
Agilent 8960 E5515C Wireless Communication Test Set | Series 10
Agilent 6672A System DC Power Supply
Tektronix TDS 2014B 100MHz 4-CH Digital Oscilloscope w/ 4 Probes
Q-Lab Calibration Kit - CT202 Thermometer, Radiometers & UC Sensors in Cases
Mark-10 M5I Digital Force and Torque Indicator with 7,000 Hz Sampling Rate, 110V

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372 item(s)/page