Advanced AI Technology Development Equipment & Micro-LED R&D Assets -Brands Hanwa, Hirayama, Bosch Rexroth, Cascade, TEL, KLA, Agilent and More
Timed auction

Auction dates

  • Ends from Oct 15, 2025 11am PT

Viewing dates

  • By appointment only

Auction details

Currency: USD
Buyer's premium: 18.00%
Sales tax: 10.25%

Venue address

7671 Hawthorne Ave Livermore, California 94550 United States

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367 item(s)
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Hanwa R CDM Model HED-C5000R – Robotic Charged Device Model (CDM) ESD Test System W575 x D400 x H300 | Weight: 35 kg | Compact desktop size High...

PVA TePla VUE-250 P – C-Mode Scanning Acoustic Microscope (CSAM) The PVA TePla VUE-250 P is a state-of-the-art C-Mode Scanning Acoustic Microsco...

Hirayama HAST Chamber PC-422R8 – Highly Accelerated Stress Test System The Hirayama HAST PC-422R8 is a high-precision chamber designed for Highl...

Hanwa HED-G5000 ESD Tester – HBM/MM Model with 1024 Pins and 6 Bias Power Supplies The Hanwa HED-G5000 is a high-end ESD tester designed for adv...

Signatone 6" Probe Station Prober

SpeedLine ACCEL MicroCel Centrifugal Cleaner System

Cascade 12000 200mm 8"" Wafer Prober

Cascade 12000 200mm 8"" Wafer Prober

Cascade 12000 200mm 8"" Wafer Prober

Signatone C312-S Manual Wafer Prober 300mm

Rucker And Koll 5” Manual Prober

Karl Suss P8 8" 200mm Manual Wafer Prober

Sistema de sonda de obleas HF KLA 1007 de KLA Instruments Corporation, diseñado para pruebas de semiconductores y sondeo de obleas

Tel P12XLn 300mm 12" Wafer Prober FULLY FUNCTIONAL

Tel P8 Fully Automatic Wafer Prober

Tektronix TLA 704 / TLA 714Logic Analyzer

Agilent U2722A Source Measure Unit

Advantest D3286 Error Detector 3.2Gbps

Anritsu MP1653A Error Detector 0.05 - 3 GHz

LaserMike Diameter Measurement System by Techmet

Agilent 6671A SYSTEM DC POWER SUPPLY

Agilent 6672A System DC Power Supply

MARATHON POWER, Model: VRME-1000-01

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