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PVA TePla VUE-250 P CSAM Acoustic Microscope System
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Description
PVA TePla VUE-250 P – C-Mode Scanning Acoustic Microscope (CSAM)
The PVA TePla VUE-250 P is a state-of-the-art C-Mode Scanning Acoustic Microscope (CSAM) designed for non-destructive inspection and analysis of electronic components, semiconductor devices, MEMS, and advanced materials. Its powerful ultrasonic imaging technology enables detailed internal inspection, revealing voids, delaminations, cracks, and other hidden defects without damaging the samples.
Equipped with a dual-monitor setup and an intuitive software interface, this system provides real-time data acquisition and high-resolution imaging for comprehensive quality control and R&D applications. It is an essential tool for manufacturers in the semiconductor, electronics, and automotive industries.
As an authorized distributor of PVA TePla equipment, we ensure the authenticity, full functionality, and proper maintenance of all our systems.
Key Features:
âÅ"… High-resolution ultrasonic imaging for defect detection
âÅ"… Real-time data acquisition and analysis
âÅ"… Dual-monitor configuration for enhanced visualization and process control
âÅ"… Ideal for semiconductor, electronics, and automotive applications
âÅ"… Backed by official support from an authorized PVA TePla distributor
Contact us today for more information or to schedule a demonstration of this advanced CSAM inspection system.
Auction Details
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T&Cs & Important Info
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PVA TePla VUE-250 P – C-Mode Scanning Acoustic Microscope (CSAM)
The PVA TePla VUE-250 P is a state-of-the-art C-Mode Scanning Acoustic Microscope (CSAM) designed for non-destructive inspection and analysis of electronic components, semiconductor devices, MEMS, and advanced materials. Its powerful ultrasonic imaging technology enables detailed internal inspection, revealing voids, delaminations, cracks, and other hidden defects without damaging the samples.
Equipped with a dual-monitor setup and an intuitive software interface, this system provides real-time data acquisition and high-resolution imaging for comprehensive quality control and R&D applications. It is an essential tool for manufacturers in the semiconductor, electronics, and automotive industries.
As an authorized distributor of PVA TePla equipment, we ensure the authenticity, full functionality, and proper maintenance of all our systems.
Key Features:
âÅ"… High-resolution ultrasonic imaging for defect detection
âÅ"… Real-time data acquisition and analysis
âÅ"… Dual-monitor configuration for enhanced visualization and process control
âÅ"… Ideal for semiconductor, electronics, and automotive applications
âÅ"… Backed by official support from an authorized PVA TePla distributor
Contact us today for more information or to schedule a demonstration of this advanced CSAM inspection system.
3-Day Auction Sales Event - Day 1
Ends from
Venue Address
7671 Hawthorne ave
Livermore
California
94550
United States
Please contact the auction company for general shipping and handling information.
Important Information
3-Day Auction Sales Event in AI Technology Development, Micro-LED Equipment -Brands Hanwa, Hirayama, Bosch Rexroth, Cascade, TEL, KLA, Keysight
Terms and Conditions
TBD
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